LETID Testing System (Light and Elevated Temperature Induced Degradation)
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A LETID test system designed in accordance with the IEC63342 standard. It can monitor dark voltages and trends by applying 2 (Isc, Imp) currents to components under specified temperature and humidity conditions.
Standards: IEC63342
- A four-wire power supply is used; the voltage sensing channel and current channel are set separately.
- It offers a user-friendly interface; high-quality industrial control computers ensure long-term stable system operation. It can monitor data such as current and temperature, recall current and temperature curves from the test process, and output and print in Excel format.
- It can record the dark voltage, record the temperature-corrected dark voltage of each component separately, and display real-time development of dark voltage data.
- It can define test stop conditions and automatically terminate the test when standard stop conditions are met.
- It can generate a test report; the report displays the dark voltage change rate and average change rate, and highlights the minimum and stop points.
- The device features an audible and visual alarm system. In the event of an alarm, the device automatically shuts down.