LETID Testing System (Light and Elevated Temperature Induced Degradation)
A LETID test system designed in accordance with the IEC63342 standard. It can monitor dark voltages and trends by applying 2 (Isc, Imp) currents to components under specified temperature and humidity conditions.
Standards: IEC63342
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A four-wire power supply is used; the voltage sensing channel and current channel are set separately.
It offers a user-friendly interface; high-quality industrial control computers ensure long-term stable system operation. It can monitor data such as current and temperature, recall current and temperature curves from the test process, and output and print in Excel format.
It can record the dark voltage, record the temperature-corrected dark voltage of each component separately, and display real-time development of dark voltage data.
It can define test stop conditions and automatically terminate the test when standard stop conditions are met.
It can generate a test report; the report displays the dark voltage change rate and average change rate, and highlights the minimum and stop points.
The device features an audible and visual alarm system. In the event of an alarm, the device automatically shuts down.