The tested component area can reach up to 2500mm x 1500mm; it is suitable for all crystalline silicon photovoltaic modules and amorphous silicon thin-film modules.
The current is program-controlled; current and voltage can be preset.
The EL image can be saved by serial number.
An emergency stop function is available.
The program automatically controls the sample current on and off and protects it from overload to prevent voltage shock to the sample.
A cylinder is used to open and close the door.
It is computer-controlled, with a fully Chinese-language interface; special requirements can be customized free of charge.
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